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| THE APPLICATION OF PEELING METHOD TO TEM ANOMALY SEPARATION |
| WU Jun-jie, DENG Xiao-hong, ZHANG Jie, WANG Xing-chun, YANG Yi |
| Institute of Geophysical and Geochemical Exploration, CAGS, Langfang 065000, China |
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Abstract Though 1D inversion method is the most mature method in the TEM interpretation process, the inversion result fails to recognize both of the conductive layers in the inversion result of the two-layer model, with only a comprehensive conductive layer shown in the result. In order to separate two conducted layers whose resistivity and thickness are similar in 1D inversion TEM method, the authors successfully used the peeling method for the anomaly separation through supposing some assumptions and on the basis of the forward and inverse calculation of l theoretical model, thus obtaining the response after peeling the first conductive layer effect. The impact caused by the neglect of common reactance was studied with rougher assumption. The calculation results show that the conducted layer located beneath a conducted layer can be displayed in the 1D TEM peeling result.
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Received: 01 March 2012
Published: 10 April 2013
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