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THE APPLICATION OF THE XRF TECHNOLOGY TO GEOLOGICAL EXPLORATION IN A CERTAIN PLACE OF XINJIANG |
HUA Yong-tao, CHENG Feng, LAI Wan-chang, YANG Qiang |
Chengdu University of Technology, Chengdu 610059, China |
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Abstract This paper presents the application of new-generation X-ray fluorescence analysis instrument (XRF) to the exploration in a certain place of Xinjiang. Some methods were used to correct the base matrix effect, moisture effect and roughness effect. More than twenty elements can be analyzed simultaneously. This instrument can play an important role in such aspects as in-situ soil and rock analysis and anomaly follow-up and verification.
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Received: 15 December 2005
Published: 24 August 2006
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