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THE APPARENT RESISTIVITY PARAMETERS IN DIRECT CURRENT IP METHOD
AND THE SECONDARY ELECTRIC FIELD SAMPLING |
ZHAO Ju-Lin, XUE Bin-Yi, FENG Jun, HE Hai-Jun |
Gansu Institute of Geological Survey, Lanzhou730000, China |
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Abstract In the direct current IP instrument used at present, the terminal time of the power supply square wave of the primary electric field sampling contains the secondary electric field formed by induction. In the high polarizability geological body, the apparent resistivity reflected by the instrument will weaken its low resistivity or enlarge its high resistivity characteristics. In field work, therefore, proper dataprocessing should be conducted so as to reduce such influence.
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Received: 07 August 2007
Published: 15 January 2009
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