Based on "self-adaptivity" and "mathematical microscope nature" of wavelet analysis in data-processing of the transient electromagnetic method, this paper has put forward the processing method and flow chart for two-dimensional wavelet transform of special TEM data, and compiled visualized processing software. The core of this technique lies in calculating the positive and negative variations of Lipschiz indexαfor distinguishing the normal field from the anomalous field so as to effectively extract pure anomalies from the TEM data. The processing of the measured TEM data from a Cu-Ni deposit has yielded satisfactory result.