X凹陷A构造低阻气层成因机理分析

程仁杰, 孙建孟, 刘建新, 迟蓬, 吕馨頔, 胡文亮, 付焱鑫, 赵文兵

Genetic mechanisms of low-resistivity gas zones in structure A of sag X

CHENG Ren-Jie, SUN Jian-Meng, LIU Jian-Xin, CHI Peng, Lyu Xin-Di, HU Wen-Liang, FU Yan-Xin, ZHAO Wen-BING

表6 各低阻成因电阻率下降量分析及参数选取

Table 6 Analysis of the decrease in resistivity of each low resistance cause and parameter selection

粘土附加导电性 定量条件 φ=0.0842、Sw=0.4 ΔR1(Qv=0.082→0.292)/(Ω·m) 16.82 物性/孔隙结构差异 定量条件 Qv=0.082 孔隙度变量 φ=0.0842 φ=0.1258 φ=0.08→0.12 ΔR2(Sw=0.4→0.6)/Ω·m 22.53 9.22 30.4