阵列侧向测井正演响应分析及环境因素快速校正方法研究
Forward analysis of array laterolog and rapid correction of environmental factors
a—层厚的影响; b—围岩电阻率的影响
a—effect of thickness; b—effect of resistivity of surrounding rocks
阵列侧向测井正演响应分析及环境因素快速校正方法研究 |
| 冯进, 倪小威, 杨清, 管耀, 刘迪仁 |
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Forward analysis of array laterolog and rapid correction of environmental factors |
| Jin FENG, Xiao-Wei NI, Qing YANG, Yao GUAN, Di-Ren LIU |
| 图5 围岩的影响 a—层厚的影响; b—围岩电阻率的影响 |
| Fig.5 Effect of surrounding rocks a—effect of thickness; b—effect of resistivity of surrounding rocks |
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