高密度电阻率法比值参数基于阻尼最小二乘反演 |
刘成功, 金胜, 魏文博, 景建恩, 叶高峰, 尹曜田 |
The least squares inversion of high-density resistivity method ratio parameter based on smooth constraint |
Cheng-Gong LIU, Sheng JIN, Wen-Bo WEI, Jian-En JING, Gao-Feng YE, Yao-Tian YIN |
图4 复杂模型剖面及参数断面 a—模型断面;b—α装置电阻率断面;c—β装置电阻率断面;d—γ装置电阻率断面;e—比值参数(T)拟断面; f—比值参数(T)反演断面 |
Fig.4 Complex model profile and parameter profile a—complex electrical geological model section; b—sectional view of resistivity of the alpha device;c—sectional view of the resistivity of the beta device; d—sectional view of the resistivity of the gamma device;e—ratio parameter (T) pseudo sectional view; f—ratio parameter (T) sectional view |
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